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TECHNOLOGIST - PIE Yield Enhancement

Micron Technology

SingaporeFull-timeOn-site

Posted 15 Jun 2026

About this role

Perform detailed physical failure analysis and inspection using SEM, TEM, and FIB to monitor process health and identify defects. Collaborate with engineering teams to resolve production issues and integrate AI-assisted tools to improve operational efficiency. Requires a diploma in Electrical, Electronics, Microelectronics, Mechatronics Engineering, or a related field. Candidates must be able to work permanent 12-hour night shifts and safely handle high-concentration chemicals.

What they're looking for

Cross-section AnalysisScanning Electron Microscopy (SEM)Transmission Electron Microscopy (TEM)Focus Ion Beam (FIB)Physical Failure AnalysisPhysical Fault IsolationReal-Time Defect Analysis (RDA)AI Literacy

Frequently asked questions

What does a TECHNOLOGIST - PIE Yield Enhancement at Micron Technology do?

Perform detailed physical failure analysis and inspection using SEM, TEM, and FIB to monitor process health and identify defects. Collaborate with engineering teams to resolve production issues and integrate AI-assisted tools to improve operational efficiency. Requires a diploma in Electrical, Elect…

What skills does this TECHNOLOGIST - PIE Yield Enhancement role need?

Key skills for this role include Cross-section Analysis, Scanning Electron Microscopy (SEM), Transmission Electron Microscopy (TEM), Focus Ion Beam (FIB), Physical Failure Analysis, Physical Fault Isolation.

How much does a TECHNOLOGIST - PIE Yield Enhancement at Micron Technology pay?

The employer did not list a salary for this role. Most similar Singapore roles publish their band on the job page.

Is this TECHNOLOGIST - PIE Yield Enhancement role remote, hybrid, or on-site?

This role is on-site, based in Singapore.

How do I apply for this TECHNOLOGIST - PIE Yield Enhancement role?

You can apply directly on Micron Technology's careers page. ApplyLah can tailor your résumé and cover letter to this exact role in seconds first.